Determination of the orientation of a stacking fault by large-angle convergent-beam electron diffraction (LACBED)

Ultramicroscopy

Volumn 66, Issue 1-2, 1996, Pages 49-57

  Wei, Xiaoli ^a,b   Duan, Xiaofeng ^a   Wang, Shengqiang ^a  

^a INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

^b Case Western Reserve University   (United States)

Author keywords

Large angle convergent beam diffraction (LACBED); Stacking fault

Indexed keywords

CRYSTAL ORIENTATION; ELECTRON BEAMS; ELECTRON DIFFRACTION; SEMICONDUCTING GALLIUM ARSENIDE; VECTORS;

LARGE ANGLE CONVERGENT BEAM ELECTRON DIFFRACTION (LACBED);

STACKING FAULTS;

GADOLINIUM ARSENIDE; UNCLASSIFIED DRUG;

ARTICLE; CRYSTAL; ELECTRON DIFFRACTION; ELECTRON MICROSCOPY;

EID: 0030292153     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(96)00079-4     Document Type: Article

References (21)

1. [1] A. Howie and M.J. Whelan, Proc. Roy. Soc. A 263 (1961) 217.
2. [2] M.J. Whelan and P.B. Hirsch, Phil. Mag. 2 (1957) 1121.
3. [3] P.B. Hirsch, A. Howie and M.J. Whelan, Phil. Trans. Roy. Soc. A 252 (1960) 499.
4. [4] H. Hashimoto, A. Howie and M.J. Whelan, Proc. Roy. Soc. A 269 (1962) 80.
5. [5] A. Art, R. Gevers and S. Amelinckx, Phys. Stat. Sol. 3 (1963) 697.
6. [6] R. Gevers, A. Art and S. Amelinckx, Phys. Stat. Sol. 18 (1963) 167.
7. [7] B. Viguier, K.J. Hemker and G. Vanderschaeve, Phil. Mag. A 69 (1994) 19.
8. [8] M. Tanaka and M. Terauchi, in: Convergent Beam Electron Diffraction-I (JEOL Ltd., Tokyo, 1985).
9. [9] K.K. Fung, Ultramicroscopy 12 (1984) 243.
10. [10] D. Cherns and A.R. Preston, in: Proc. 11th Internat. Congr. on Electron Microscopy, Kyoto (Japan Society of Electron Microscopy, Tokyo, 1986) p. 721.
11. [11] D. Cherns and A.R. Preston, J. Electron. Microsc. Technique 13 (1989) 111.
12. [12] M. Tanaka, M. Terauchi and T. Kaneyama, in: Convergent Beam Electron Diffraction-II (JEOL Ltd., Tokyo, 1988).
13. [13] F. Niu, R. Wang and G. Lu, Acta Crystallogr. A 47 (1991) 36.
14. [14] J.P. Morniroli and J.W. Steeds, in: Proc. Electron Microscopy and Analysis Group, Institute of Physics Conf. Series No. 119 (Institute of Physics, Bristol, 1991) p. 417-420.
15. [15] C.T. Chou, A.R. Preston and J.W. Steeds, Phil. Mag. A 65 (1992) 863.
16. [16] M. Tanaka, S. Yamada and M. Terauchi, in: Proc. 5th Asia Pacific Electron Microscopy Conf. (1992) p. 154.
17. [17] X.F. Duan, Ultramicroscopy 41 (1992) 249.
18. [18] L.-M. Peng and M.J. Whelan, Proc. Roy. Soc. A 431 (1990) 111.
19. [19] S.Q. Wang, L.-M. Peng, Y. Xin, Y.M. Chu and X.F. Duan, Phil. Mag. Lett. 66 (1992) 225.
20. [20] D. Cherns and J.-P. Morniroli, Ultramicroscopy 53 (1994) 167.
21. [21] Y. Xin and X.F. Duan, in: Proc. 5th Asia Pacific Electron Microscopy Conf. (1992) p. 160.