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Volumn 212, Issue 1-4, 2003, Pages 420-425

Evidence of Coulomb explosion sputtering of ultra-thin Pt films due to impact of multi-charged Ar ions

Author keywords

[No Author keywords available]

Indexed keywords

ARGON; PLATINUM; POTENTIAL ENERGY; SPUTTERING; ULTRATHIN FILMS;

EID: 0242369064     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(03)01743-9     Document Type: Conference Paper
Times cited : (11)

References (21)
  • 4
    • 0242345895 scopus 로고    scopus 로고
    • J. Gillaspy. Nova Science Publishers. Chapter 17
    • Parilis E. Gillaspy J. Trapping Highly Charged Ions. 2000;407 Nova Science Publishers. (Chapter 17).
    • (2000) Trapping Highly Charged Ions , pp. 407
    • Parilis, E.1
  • 20
    • 4243958780 scopus 로고    scopus 로고
    • private communication
    • Z. Šroubek, private communication.
    • Šroubek, Z.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.