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Volumn 212, Issue 1-4, 2003, Pages 246-252
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Evolution of thin-film morphologies in metals during ion beam bombardment
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SIMULATION;
ION BEAMS;
ION BOMBARDMENT;
MOLECULAR DYNAMICS;
MORPHOLOGY;
STRESS RELAXATION;
SURFACE ROUGHNESS;
VISCOSITY;
IRRADIATION PARTICLES;
THIN FILMS;
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EID: 0242300780
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(03)01421-6 Document Type: Conference Paper |
Times cited : (8)
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References (15)
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