Concurrent Error Detection in Linear Analog Circuits Using State Estimation

IEEE International Test Conference (TC)

Volumn , Issue , 2003, Pages 1164-1173

  Stratigopoulos, H G D ^a   Makris, Yiorgos ^a  

^a Yale University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; EIGENVALUES AND EIGENFUNCTIONS; ERROR DETECTION; STATE ESTIMATION;

ANALOG CIRCUITS;

INTEGRATED CIRCUIT TESTING;

EID: 0142246852     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (20)

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