X-ray photoelectron spectroscopy study of MoTe 2 single crystals and thin films

Applied Surface Science

Volumn 219, Issue 3-4, 2003, Pages 238-248

  Bernede J C ^a   Amory, C ^a   Assmann, L ^a   Spiesser, M ^b  

^a UNIVERSITÉ DE NANTES   (France)

^b IMJR CNRS   (France)

Author keywords

Chalcogenide; Lamellar semiconductor; Molybdenum ditelluride; X ray photoelectron spectroscopy

Indexed keywords

BINDING ENERGY; MOLYBDENUM COMPOUNDS; SYNTHESIS (CHEMICAL); THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

SUPERFICIAL OXIDATION;

SINGLE CRYSTALS;

EID: 0142216196     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(03)00697-4     Document Type: Article

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