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Volumn 546, Issue 1, 2003, Pages 47-56

Ultra-thin film growth of titanium dioxide on W(1 0 0)

Author keywords

Growth; Low energy electron diffraction (LEED); Single crystal surfaces; Titanium oxide; Tungsten oxide; X ray photoelectron spectroscopy

Indexed keywords

ANNEALING; FILM GROWTH; LOW ENERGY ELECTRON DIFFRACTION; SINGLE CRYSTALS; TUNGSTEN; ULTRATHIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0142216159     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2003.09.015     Document Type: Article
Times cited : (31)

References (26)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.