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Surface Science

Volumn 447, Issue 1, 2000, Pages 201-211

X-ray photoelectron diffraction study of an anatase thin film: TiO2(001)

(4) Herman, G S a Gao, Y a Tran, T T a Osterwalder, J b

a PACIFIC NORTHWEST NATIONAL LABORATORY (United States)

b UNIVERSITY OF ZURICH (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

BINDING ENERGY; ELECTRONIC PROPERTIES; FILM GROWTH; LOW ENERGY ELECTRON DIFFRACTION; METALLORGANIC CHEMICAL VAPOR DEPOSITION; POLYCRYSTALLINE MATERIALS; THIN FILMS; TITANIUM DIOXIDE; VACUUM APPLICATIONS; X RAY PHOTOELECTRON SPECTROSCOPY;

ANATASE; X RAY PHOTOELECTRON DIFFRACTION (XPD);

STRONTIUM COMPOUNDS;

EID: 0033880302 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(99)01186-3 Document Type: Article

Times cited : (90)

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