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Volumn 400, Issue 1-2, 2001, Pages 43-45

Thin film TiO2 on nickel(110): An STM study

Author keywords

Growth; Low index single crystal surfaces; Scanning tunnelling microscopy; Semiconducting films; Titanium oxide

Indexed keywords

CRYSTAL ORIENTATION; FILM GROWTH; LOW ENERGY ELECTRON DIFFRACTION; NICKEL; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING FILMS; SINGLE CRYSTALS; TITANIUM OXIDES; VAPOR DEPOSITION;

EID: 0035803172     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(01)01445-6     Document Type: Conference Paper
Times cited : (28)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.