The testability features of the ARM1026EJ microprocessor core

IEEE International Test Conference (TC)

Volumn , Issue , 2003, Pages 773-782

  McLaurin, Teresa L ^a   Frederick, Frank ^a   Slobodnik, Rich ^a  

^a ARM Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DESIGN FOR TESTABILITY; INTERFACES (COMPUTER); LOGIC DESIGN; MICROPROCESSOR CHIPS;

WRAPPER CELLS;

BUILT-IN SELF TEST;

EID: 0142215967     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)

1. E.J. Marinissen, T. McLaurin, Rohit Kapur, Maurice Lousberg, Mike Ricchetti, Yervant Zorian, "On IEEE P1500's Standard for Embedded Core Test", Journal of Electronic Testing: Theory and Application 18, 2002, Kluwer Academic Pulishers, pp. 365-383
2. D.Amason, et al., "A Case Study of the Test Development for the 2nd Generation ColdFire Microprocessors", International Test Conference, 1997, pp. 424-432