메뉴 건너뛰기




Volumn 83, Issue 14, 2003, Pages 2799-2801

Quantitative assessment of Al-to-N bonding in dilute Al 0.33Ga0.67As1-yNy

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; NITROGEN; RAMAN SPECTROSCOPY; SECONDARY ION MASS SPECTROMETRY; X RAY ANALYSIS;

EID: 0142186252     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1616991     Document Type: Article
Times cited : (20)

References (16)
  • 1
    • 0142139468 scopus 로고    scopus 로고
    • Special issue: III-N-V Semiconductor Alloys
    • For a recent overview see, e.g., Special issue: III-N-V Semiconductor Alloys, Semicond. Sci. Technol. 17 (2002).
    • (2002) Semicond. Sci. Technol. , vol.17
  • 15
    • 0142232193 scopus 로고    scopus 로고
    • 2 deformation potentials rather than by the deformation potential itself.
    • 2 deformation potentials rather than by the deformation potential itself.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.