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Volumn 72, Issue 3, 2003, Pages 307-312
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Conduction and dielectric polarization in Se thin films
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Author keywords
Dielectric loss and relaxation; Metal insulator metal structures; Thin films
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Indexed keywords
DIELECTRIC MATERIALS;
ELECTRIC CONDUCTIVITY;
EVAPORATION;
METAL INSULATOR BOUNDARIES;
SELENIUM;
X RAY DIFFRACTION ANALYSIS;
DIELECTRIC POLARIZATION;
THIN FILMS;
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EID: 0142186045
PISSN: 0042207X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.vacuum.2003.08.008 Document Type: Article |
Times cited : (28)
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References (22)
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