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Volumn 267, Issue 2, 2003, Pages 139-151
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Simulation of spin-resolved scanning tunneling microscopy: Influence of the magnetization of surface and tip
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Author keywords
Adhesion; Conductivity; Density functional calculations; Electronic structure; First principles simulations; Magnetic surfaces; Scanning tunneling microscopy
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Indexed keywords
ADHESION;
ANTIFERROMAGNETIC MATERIALS;
COMPUTER SIMULATION;
ELECTRIC CONDUCTIVITY;
ELECTRONIC STRUCTURE;
IMAGE ANALYSIS;
PROBABILITY DENSITY FUNCTION;
SCANNING TUNNELING MICROSCOPY;
SURFACE PHENOMENA;
SURFACES;
MAGNETIC SURFACES;
MAGNETIZATION;
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EID: 0142153928
PISSN: 03048853
EISSN: None
Source Type: Journal
DOI: 10.1016/S0304-8853(03)00346-9 Document Type: Article |
Times cited : (11)
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References (25)
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