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Volumn 267, Issue 2, 2003, Pages 139-151

Simulation of spin-resolved scanning tunneling microscopy: Influence of the magnetization of surface and tip

Author keywords

Adhesion; Conductivity; Density functional calculations; Electronic structure; First principles simulations; Magnetic surfaces; Scanning tunneling microscopy

Indexed keywords

ADHESION; ANTIFERROMAGNETIC MATERIALS; COMPUTER SIMULATION; ELECTRIC CONDUCTIVITY; ELECTRONIC STRUCTURE; IMAGE ANALYSIS; PROBABILITY DENSITY FUNCTION; SCANNING TUNNELING MICROSCOPY; SURFACE PHENOMENA; SURFACES;

EID: 0142153928     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-8853(03)00346-9     Document Type: Article
Times cited : (11)

References (25)
  • 4
    • 0034625659 scopus 로고    scopus 로고
    • Heinze S.et al. Science. 288:2000;1805.
    • (2000) Science , vol.288 , pp. 1805
    • Heinze, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.