Dielectric properties of Fe-doped BaxSr1-xTiO 3 thin films on polycrystalline substrates at temperatures between -35 and +85 °C

Solid-State Electronics

Volumn 47, Issue 12, 2003, Pages 2199-2203

  Lorenz, M ^a   Hochmuth, H ^a   Schallner, M ^b   Heidinger, R ^c   Spemann, D ^a   Grundmann, M ^a  

^a UNIVERSITY OF LEIPZIG   (Germany)

^b Siemens Enterprise Communications GmbH & Co KG   (Germany)

^c KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

Author keywords

Barium strontium titanate; Dielectric constant; Ferroelectric thin films; Loss tangent; Pulsed laser deposition

Indexed keywords

BARIUM COMPOUNDS; DOPING (ADDITIVES); IRON; PERMITTIVITY; POLYCRYSTALLINE MATERIALS; PULSED LASER DEPOSITION;

POLYCRYSTALLINE SUBSTRATES;

THIN FILMS;

EID: 0142106862     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(03)00197-7     Document Type: Article

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