A statistical analysis of laser ablated Ba0.50Sr0.50TiO3/LaAlO3 films for microwave applications

Materials Research Society Symposium - Proceedings

Volumn 720, Issue , 2002, Pages 111-122

  Romanofsky, R R ^a   Varaljay, N C ^a   Alterovitz, S A ^a   Miranda, F A ^a   Mueller, C M ^b   VanKeuls, F W ^c   Kim, J ^d   Harshavardhan, K S ^d  

^a NASA GLENN RESEARCH CENTER   (United States)

^b Hadron Inc   (United States)

^c OHIO AEROSPACE INSTITUTE   (United States)

^d Neocera Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; BARIUM COMPOUNDS; CRYSTALLINE MATERIALS; DOPING (ADDITIVES); FERROELECTRIC MATERIALS; INSERTION LOSSES; MICROSTRUCTURE; MICROWAVES; PHASE SHIFT; PHASE SHIFTERS; REFRACTIVE INDEX; X RAY DIFFRACTION ANALYSIS;

FERROELECTRIC THIN FILMS;

THIN FILMS;

EID: 0036456252     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-720-h4.1     Document Type: Conference Paper

References (8)

1. E. Brookner, Microwave Journal, May, 1997, pp. 288-293.
2. E. Brookner, Microwave Journal, June, 1997, pp. 84-92.
3. R. Romanofsky et al., IEEE Tran. Microwave Theory Tech., 48, No. 12, pp. 2504-2510 (2000).
4. C. Mueller et al., MRS Spring Meeting, San Francisco, CA, April 24-28, (2000).
5. R. Romanofsky et al., Integrated Ferroelectrics, Vol. 39, pp. 1249-1260, (2001).
6. D. Kajfez and E.J. Hwan, IEEE Trans. Microwave Theory Tech, 32, No. 7, pp. 66-670, (1984).
7. T.C. Edwards, Foundations for Microstrip Circuit Design, John Wiley & Sons, 1981.
8. R. Romanofsky and A. Qureshi, IEEE Trans. Mag., 36, No. 5, pp. 3491-3494 (2000).