Spatial characterization of monolithic multi-element Silicon-Drift-Detectors for X-ray spectroscopic applications

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 467-468, Issue PART II, 2001, Pages 1163-1166

  Kappen, P ^a   Troger L ^a   Hansen, K ^a   Reckleben, Ch ^a   Lechner, P ^b   Strssuder L ^c   Materlik, G ^a  

^a DESY   (Germany)

^b KETEK GMBH   (Germany)

^c MPI HALBLEITERLABOR   (Germany)

Author keywords

Detector characterization; Local performance; Multi element; Peak to background ratio; Silicon drift detector; X ray spectroscopy

Indexed keywords

EID: 0001486765     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(01)00586-1     Document Type: Article

References (6)

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6. P. Kappen et al., J. Catal. 198 (1) (2001) 56.