Probing carriers in two-dimensional systems with high spatial resolution by scanning spreading resistance microscopy

Applied Physics Letters

Volumn 83, Issue 11, 2003, Pages 2184-2186

  Maknys, K ^a   Douheret O ^a   Anand, S ^a  

^a ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; DOPING (ADDITIVES); MICROSCOPIC EXAMINATION; SEMICONDUCTING INDIUM GALLIUM ARSENIDE; SILICON;

SPATIAL RESOLUTION;

SEMICONDUCTOR QUANTUM WELLS;

EID: 0142089992     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1611619     Document Type: Article

References (5)

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