Considerations on the accuracy of lattice parameters determined from HRTEM images

Microscopy and Microanalysis

Volumn 9, Issue SUPPL. 3, 2003, Pages 166-167

  Biskupek, Johannes ^a   Kaiser, Ute ^a   Chuvilin, Andrey ^a  

^a FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0142059742     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s1431927603021007     Document Type: Conference Paper

References (4)

1. Bauer, A., Kräußlich, J., Dressler, L., Kuschnerus, P., Wolf, J., and Goetz, K, Phys. Rev. B 57 (1998) 2647
2. Browning, N.D., Arslan, I., Ito, Y., James, E.M., Klie, R.F., Moeck, P., Topuria, T., Xin, Y., Journal of. Electron Microsopyc. 50 (2001) 208
3. S. Krämer, J. Mayer, C. Witt, A. Weickenmeier, M. Rühle, Ultramicroscopy 81 (2000) 245
4. Kaiser, U., Kups, Th., Fissel, A., Richter, W., 2002, Crystal Res. a. Tech. 37 (2002) 466