Experiencies and possibilities with a 200 kV monochromated (S)TEM

Microscopy and Microanalysis

Volumn 9, Issue SUPPL. 3, 2003, Pages 80-81

  Kothleitner, Gerald ^a   Hofer, Ferdinand ^a  

^a GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0142028673     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s143192760301314x     Document Type: Conference Paper

References (8)

1. Tiemeijer, P.C., van Lin, J.H.A., Freitag, B., and de Jong, A.F., (2002), M&M. 8 (2), p70
2. Brink, H.A., Barfels, M.M.G., Burgner, R.P., and Edwards, B.N. (2003), to be published in Ultramicroscopy
3. Mitterbauer, C., Kothleitner, G., Grogger, W., Zandbergen, H., Tiemeijer, P., Freitag, B., and Hofer, F., (2003), Ultramicroscopy (accepted for publication)
4. Müller, J. E., and Wilkins, J. W., (1984) Physical Review B 29, p4331
5. Weijs, P. J. W., Czyžyk, M. T., van Acker, J. F., Speier, W., van der Laan, G., Buschow, K. H. J., Wiech, G., and Fuggle, J. C., (1990) Physical Review B 41, p11899
6. Muller, D. A., Singh, D. J. and Silcox, J., (1998) Physical Review B 57, p8181
7. Nufer, S., Marinopoulos, G., Gemming, T., Elsässer, C, Kurtz, W., Köstlmeier, S., and Rühle, M., (2001) Physical Review Letters 86 (22), p5066
8. P. Tiemeijer and B. Kraus are thanked for their help during the first steps with the monochromator.