Analytical electron microscopy and Auger electron spectroscopy study of low-temperature diffusion in multilayer chromium-copper-nickel-gold thin films

Thin Solid Films

Volumn 444, Issue 1-2, 2003, Pages 75-84

  Danylenko, M I ^a   Watanabe, M ^b   Li, C ^b   Krajnikov, A V ^a   Williams, D B ^b   Vasiliev, M A ^c  

^a FRANTSEVICH INSTITUTE FOR PROBLEMS OF MATERIALS SCIENCE   (Ukraine)

^b Lehigh University   (United States)

^c INSTITUTE OF METAL PHYSICS   (Ukraine)

Author keywords

Auger electron spectroscopy; Diffusion; Electron microscopy; Grain boundary

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CHROMIUM; COPPER; DIFFUSION; GOLD; LOW TEMPERATURE EFFECTS;

LOW-TEMPERATURE DIFFUSION;

MULTILAYERS;

EID: 0142011473     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(03)01107-6     Document Type: Article

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