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Volumn 156, Issue , 1998, Pages 215-222
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Low-temperature interdiffusion in binary and multilayer thin film system
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Author keywords
Auger Electron Spectroscopy; Diffusion; Interfaces; Thin Film
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Indexed keywords
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EID: 0142101286
PISSN: 10120386
EISSN: 16629507
Source Type: Journal
DOI: 10.4028/www.scientific.net/ddf.156.215 Document Type: Article |
Times cited : (5)
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References (22)
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