Improved technique for measuring refractive index and thickness of a transparent plate

Optics Communications

Volumn 226, Issue 1-6, 2003, Pages 135-140

  Jian, Zhi Cheng ^a   Hsu, Cheng Chih ^a   Su, Der Chin ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

Heterodyne interferometry; Phase measurement; Refractive index; Thickness

Indexed keywords

INTERFEROMETRY; LIGHT POLARIZATION; PHASE MEASUREMENT; REFRACTIVE INDEX;

HETERODYNE INTERFEROMETRY;

LIGHT REFLECTION;

EID: 0141998026     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2003.09.010     Document Type: Article

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