Low–coherence interferometer system for the simultaneous measurement of refractive index and thickness

Applied Optics

Volumn 41, Issue 7, 2002, Pages 1315-1322

  Maruyama, Hideki ^a   Inoue, Shogo ^b,c   Mitsuyama, Teruki ^b,d   Ohmi, Masato ^b   Haruna, Masamitsu ^b  

^a Kyushu Matsushita Electric Co   (Japan)

^b OSAKA UNIVERSITY   (Japan)

^c FUJITSU LABORATORIES LTD   (Japan)

^d TOKYO ELECTRIC POWER COMPANY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; CALIBRATION; INSTRUMENTATION; INTERFEROMETRY; REFRACTOMETRY; THEORETICAL MODEL;

CALIBRATION; INTERFEROMETRY; MODELS, THEORETICAL; REFRACTOMETRY;

COHERENT LIGHT; DISPERSION (WAVES); OPTICAL DISK STORAGE; OPTICAL GLASS; REFRACTIVE INDEX; SCANNING; THIN FILMS;

CHROMATIC DISPERSION; PHASE INDEX;

INTERFEROMETERS;

EID: 0036489385     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.41.001315     Document Type: Article

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