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Volumn 19, Issue 9, 2003, Pages 1298-1308

Atomic force microscopy characterisation of scratch deformation in long and short chain isotactic polypropylenes and ethylene-propylene copolymers

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEFORMATION; POLYPROPYLENES; SCANNING ELECTRON MICROSCOPY;

EID: 0141995049     PISSN: 02670836     EISSN: None     Source Type: Journal    
DOI: 10.1179/026708303225004530     Document Type: Article
Times cited : (16)

References (36)
  • 1
    • 0035482578 scopus 로고    scopus 로고
    • B. BHUSHAN: Wear, 2001, 251, 1105.
    • (2001) Wear , vol.251 , pp. 1105
    • Bhushan, B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.