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Volumn 19, Issue 9, 2003, Pages 1298-1308
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Atomic force microscopy characterisation of scratch deformation in long and short chain isotactic polypropylenes and ethylene-propylene copolymers
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
DEFORMATION;
POLYPROPYLENES;
SCANNING ELECTRON MICROSCOPY;
SCRATCH DEFORMATION;
COPOLYMERS;
COPOLYMER;
ETHYLENE DERIVATIVE;
ETHYLENE PROPYLENE COPOLYMER;
POLYPROPYLENE;
UNCLASSIFIED DRUG;
ANALYTIC METHOD;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
CRYSTAL STRUCTURE;
CRYSTALLIZATION;
IMAGE ANALYSIS;
INTERMETHOD COMPARISON;
MATERIALS;
MATERIALS TESTING;
PHYSICAL CHEMISTRY;
POLYMERIZATION;
PREDICTION;
PROCESS MODEL;
QUALITATIVE ANALYSIS;
QUANTITATIVE ANALYSIS;
SCANNING ELECTRON MICROSCOPY;
SCRATCHING;
SURFACE PROPERTY;
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EID: 0141995049
PISSN: 02670836
EISSN: None
Source Type: Journal
DOI: 10.1179/026708303225004530 Document Type: Article |
Times cited : (16)
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References (36)
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