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Volumn 19, Issue 2, 2003, Pages 239-243

Micro- and nano-scale deformation processes during scratch damage in high density polyethylene

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRACK INITIATION; DEFORMATION; SCANNING ELECTRON MICROSCOPY; STRAIN RATE;

EID: 0038106030     PISSN: 02670836     EISSN: None     Source Type: Journal    
DOI: 10.1179/026708303225009364     Document Type: Article
Times cited : (32)

References (20)
  • 6
    • 0031640101 scopus 로고    scopus 로고
    • Anaheim, CA, USA, Covina, CA, SAMPE
    • J. CHU: Proc. 1998 Int. SAMPE Symp., Anaheim, CA, USA, Vol. 43, 1149; 1998, Covina, CA, SAMPE.
    • (1998) Proc. 1998 Int. SAMPE Symp. , vol.43 , pp. 1149
    • Chu, J.1
  • 17
  • 19
    • 0345251767 scopus 로고
    • Metals Park, OH, American Society for Metals
    • A. PETERLIN: 'Polymeric materials', 175; 1975, Metals Park, OH, American Society for Metals.
    • (1975) Polymeric Materials , vol.175
    • Peterlin, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.