Development of low-force copper contact processes

Electrical Contacts, Proceedings of the Annual Holm Conference on Electrical Contacts

Volumn , Issue , 2003, Pages 228-233

  Kataoka, Kenichi ^a   Itoh, Toshihiro ^a   Okumura, Katsuya ^a   Suga, Tadatomo ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

Deoxidization of Cu; Fritting contact; IC probing

Indexed keywords

COPPER; COPPER OXIDES; ELECTRIC BREAKDOWN; ELECTRIC RESISTANCE; ELECTRODES; HEAT TREATMENT; HYDROGEN; IRON ALLOYS; NICKEL ALLOYS; X RAY PHOTOELECTRON SPECTROSCOPY;

COPPER CONTACT PROCESS; DEOXIDATION PROCESS; FRITTING PROCESS; LOW-FORCE CONTACT METHOD;

ELECTRIC CONTACTS;

EID: 0141904971     PISSN: 03614395     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

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