Phase noise measurements of low power signals

Electronics Letters

Volumn 39, Issue 19, 2003, Pages 1389-1390

  Rubiola, E ^a   Salik, E ^b   Yu, Nan ^b   Maleki, L ^b  

^a INSTITUT JEAN LAMOUR   (France)

^b CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFICATION; BIPOLAR TRANSISTORS; MICROWAVE AMPLIFIERS; MICROWAVES; MIXER CIRCUITS; OPTICAL FIBERS; PHOTODETECTORS; SCHOTTKY BARRIER DIODES; SIGNAL DETECTION;

MICROWAVE SIGNALS; PHASE NOISE; POWER SPECTRAL DENSITY;

SIGNAL NOISE MEASUREMENT;

EID: 0141904680     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:20030878     Document Type: Article

References (4)

1. Halford, D., Wainwright, A.E., and Barnes, J.A.: 'Flicker noise of phase in RF amplifiers: characterization, cause, and cure'. Proc. Freq. Contr. Symp., 22-24 Apr. 1968, pp. 340-341
2. Walls, F.L., Ferre-Pikal, E.S., and Jefferts, S.R.: 'Origin of 1/f PM and AM noise in bipolar junction transistor amplifiers', IEEE Trans. Ultras. Ferroel. Freq. Contr., 1997, 44, pp. 326-334
3. Hati, A., Howe, D., Walker, D., and Walls, F.: 'Noise figure vs. PM noise measurements: a study at microwave frequencies'. Proc. Freq. Contr. Symp., May 2003 (in print)
4. Rubiola, E., and Giordano, V.: 'Advanced interferometric phase and amplitude noise measurements', Rev. Sci. Instr., 2002, 73, pp. 2445-2457