Noise Figure vs. PM Noise Measurements: A Study at Microwave Frequencies

Proceedings of the Annual IEEE International Frequency Control Symposium

Volumn , Issue , 2003, Pages 516-520

  Hati, A ^a   Howe, D A ^a   Walls, F L ^b   Walker, D ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b TOTAL   (France)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLITUDE MODULATION; COMPUTATIONAL METHODS; INTERMODULATION; MEASUREMENT THEORY; MICROWAVES; NONLINEAR DISTORTION; PHASE MODULATION; WHITE NOISE;

MICROWAVE FREQUENCIES; PHASE MODULATION (PM) NOISE MEASUREMENT];

THERMAL NOISE;

EID: 1542275581     PISSN: 01616404     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)

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2. Fred L. Walls, Eva S. Ferre-Pikal, Steven R. Jefferts, "Origin of 1/f PM noise and AM noise in bipolar junction transistor amplifiers, IEEE Transactions on Ultrasonics, Ferroelectronics and Frequency Control, Vol. 44, No. 2 March 1997, pp. 326-334.
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