Advanced interferometric phase and amplitude noise measurements

Review of Scientific Instruments

Volumn 73, Issue 6, 2002, Pages 2445-

  Rubiola, Enrico ^a   Giordano, Vincent ^b  

^a UNIVERSITÉ DE LORRAINE   (France)

^b CNRS   (France)

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Indexed keywords

EID: 0036608505     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1480458     Document Type: Article

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