Automated system for noise-measurements on low-ohmic samples and magnetic sensors

IEEE Transactions on Instrumentation and Measurement

Volumn 48, Issue 3, 1999, Pages 730-735

  Jonker, R J W ^a   Briaire, J ^a   Vandamme, L K J ^a  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; COMPUTER CONTROL SYSTEMS; COMPUTER SOFTWARE; DIGITAL CONTROL SYSTEMS; ELECTRIC CURRENTS; MAGNETIC FIELDS; MAGNETIC MEASURING INSTRUMENTS; METALLIC FILMS; SENSORS; SPECTRUM ANALYSIS;

AUTOMATED SYSTEM; MAGNETIC SENSORS; SOFTWARE PACKAGE LABVIEW;

SIGNAL NOISE MEASUREMENT;

EID: 0032666719     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.772210     Document Type: Article

References (12)

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