Effect of Oxidation Process on Grain-Size Reduction for Longitudinal Media Using Ni-Based Amorphous Seedlayer

IEEE Transactions on Magnetics

Volumn 39, Issue 5 II, 2003, Pages 2258-2260

  Mikami, Masaki ^a,b   Djayaprawira, D D ^a   Yoshimura, S ^a   Takahashi, M ^a  

^a TOHOKU UNIVERSITY   (Japan)

^b ASAHI GLASS CO LTD   (Japan)

Author keywords

Amorphous seedlayer; Longitudinal media; Oxidation; Thin film

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; GLASS; GRAIN SIZE AND SHAPE; MAGNETIC THIN FILMS; MAGNETIZATION; MAGNETOMETERS; MAGNETRON SPUTTERING; NICKEL ALLOYS; OXIDATION; REDUCTION; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

MAGNETIC SEEDLAYERS;

AMORPHOUS ALLOYS;

EID: 0141885027     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2003.816264     Document Type: Article

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