Dependence of thin-film media microstructure and recording properties on composition of very thin Cr-based seedlayers

IEEE Transactions on Magnetics

Volumn 38, Issue 5 I, 2002, Pages 1958-1960

  Yoshimura, Satoru ^a   Djayaprawira, David D ^a   Mikami, Masaki ^a   Takakuwa, Yuji ^a   Takahashi, Migaku ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

Auger electron spectroscope (AES); Island or layer like structure; Melting point; Reflection high energy electron diffraction (RHEED); Very thin Cr based seedlayer

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CHROMIUM; CRYSTALLOGRAPHY; MAGNETIC THIN FILMS; MICROSTRUCTURE; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SPURIOUS SIGNAL NOISE;

MELTING POINT; SEEDLAYERS;

MAGNETIC RECORDING;

EID: 0036763034     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2002.802789     Document Type: Article

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