Measurement of out-of-plane static and dynamic deformations by processing digital speckle pattern interferometry fringes using wavelet transform

Optics and Lasers in Engineering

Volumn 41, Issue 1, 2004, Pages 81-93

  Kumar, Rajesh ^a   Singh, I P ^a   Shakher, Chandra ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY DELHI   (India)

Author keywords

Deformations; Digital speckle pattern interferometry (DSPI); Histogram equalization; Signal to noise ratio (SNR); Symlet wavelet

Indexed keywords

ACCELEROMETERS; DEFORMATION; INTERFEROMETRY; SIGNAL TO NOISE RATIO; WAVELET TRANSFORMS;

SPECKLE INTERFEROGRAMS;

SPECKLE;

EID: 0141838989     PISSN: 01438166     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0143-8166(02)00118-5     Document Type: Article

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