Quantitative non-destructive evaluation of advanced composite panels using optical interferometric techniques

Insight: Non-Destructive Testing and Condition Monitoring

Volumn 41, Issue 4, 1999, Pages 244-249

  Lam, C L ^a   Lalor, M J ^b   Burton, D R ^b   Leung, T P ^a  

^a HONG KONG POLYTECHNIC UNIVERSITY   (Hong Kong)

^b LIVERPOOL JOHN MOORES UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; CHARGE COUPLED DEVICES; COMPOSITE MATERIALS; FINITE ELEMENT METHOD; INTERFEROMETRY; LASER BEAMS; NONDESTRUCTIVE EXAMINATION; PRISMS; SPECKLE; STRAIN; STRUCTURAL ANALYSIS;

ELECTRONIC SHEAROGRAPHY TECHNIQUES; SHEAR SPECKLE PATTERN INTERFEROMETRY; WOLLASTON PRISMS;

STRUCTURAL PANELS;

EID: 0032632186     PISSN: 13542575     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (12)

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