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Volumn 42, Issue 7 B, 2003, Pages
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Effect of C/Si ratio on spiral growth on 6H-SiC (0001)
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Author keywords
Atomic force microscopy (AFM); Chemical vapor deposition (CVD); Silicon carbide (SiC); Spiral growth; Step flow growth
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CARBON;
CHEMICAL VAPOR DEPOSITION;
CRYSTAL STRUCTURE;
DISLOCATIONS (CRYSTALS);
EPITAXIAL GROWTH;
SILICON;
STACKING FAULTS;
CARBON TO SILICON RATIO;
SCREW DISLOCATION;
SPIRAL GROWTH;
STEP-FLOW GROWTH;
SILICON CARBIDE;
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EID: 0141829758
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.42.l846 Document Type: Letter |
Times cited : (33)
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References (12)
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