Surface core level shifts of Yb films in the multilayer, monolayer and submonolayer range

Zeitschrift fur Anorganische und Allgemeine Chemie

Volumn 629, Issue 10, 2003, Pages 1805-1811

  Muller F ^a   Stowe K ^a  

^a SAARLAND UNIVERSITY   (Germany)

Author keywords

Electron beam evaporation; Interface core level shift; Monolayer; Photoelectron spectroscopy; Submonolayer; Surface core level shift; Tungsten; UPS; XPS; Ytterbium

Indexed keywords

LANTHANIDE; TUNGSTEN; YTTERBIUM;

ARTICLE; ELECTRON TRANSPORT; FILM; THICKNESS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0141818029     PISSN: 00442313     EISSN: None     Source Type: Journal    
DOI: 10.1002/zaac.200300132     Document Type: Article

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