3-Transistor Antifuse OTP ROM Array using Standard CMOS Process

IEEE Symposium on VLSI Circuits, Digest of Technical Papers

Volumn , Issue , 2003, Pages 239-242

  Kim, Jinbong ^a   Lee, Kwyro ^a  

^a MICROS Research Center   (South Korea)

Author keywords

CMOS antifuse; Gate oxide breakdown; OTP ROM array

Indexed keywords

DYNAMIC RANDOM ACCESS STORAGE; ELECTRIC FIELD EFFECTS; ROM;

GATE-OXIDE BREAKDOWN;

CMOS INTEGRATED CIRCUITS;

EID: 0141761381     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

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