One time programmable drift antifuse cell reliability

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 2000, Pages 169-173

  Candelier, Philippe ^a   Villani, Nathalie ^a   Schoellkopf, Jean Pierre ^a   Mortini, Patrick ^a  

^a STMICROELECTRONICS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC BREAKDOWN OF SOLIDS; ELECTRIC CURRENTS; GATES (TRANSISTOR); OPTIMIZATION;

TIME PROGRAMMABLE DRIFT ANTIFUSE CELLS;

NONVOLATILE STORAGE;

EID: 0033741473     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (12)