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Volumn 159, Issue 2, 2003, Pages 399-410

Identification of contact regions in semiconductor transistors by level-set methods

Author keywords

Inverse problem; Level set methods; Semiconductor

Indexed keywords

INVERSE PROBLEMS; PROBLEM SOLVING; SET THEORY; TRANSISTORS;

EID: 0141750666     PISSN: 03770427     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0377-0427(03)00543-0     Document Type: Article
Times cited : (7)

References (15)
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  • 2
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    • Identification of semiconductor contact resistivity
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  • 4
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    • (1992) SIAM J. Appl. Math. , vol.52 , pp. 699-709
    • Fang, W.1    Cumberbatch, E.2
  • 5
    • 0036665087 scopus 로고    scopus 로고
    • Parameter identification for semiconductor diodes by LBIC imaging
    • Fang W. Ito K. Redfern D. Parameter identification for semiconductor diodes by LBIC imaging SIAM J. Appl. Math. 62 2002 2149-2174
    • (2002) SIAM J. Appl. Math. , vol.62 , pp. 2149-2174
    • Fang, W.1    Ito, K.2    Redfern, D.3
  • 7
    • 0035473295 scopus 로고    scopus 로고
    • Level-set function approach to an inverse interface problem
    • Ito K. Kunisch K. Li Z. Level-set function approach to an inverse interface problem Inverse Problems 17 2001 1225-1242
    • (2001) Inverse Problems , vol.17 , pp. 1225-1242
    • Ito, K.1    Kunisch, K.2    Li, Z.3
  • 8
    • 0034503787 scopus 로고    scopus 로고
    • Weighted ENO schemes for Hamilton-Jacobi equations
    • Jiang G.-S. Peng D. Weighted ENO schemes for Hamilton-Jacobi equations SIAM J. Sci. Comput. 21 2000 2126-2143
    • (2000) SIAM J. Sci. Comput. , vol.21 , pp. 2126-2143
    • Jiang, G.-S.1    Peng, D.2
  • 9
    • 0000386587 scopus 로고    scopus 로고
    • Reconstruction of a two-dimensional binary obstacle by controlled evolution of a level-set
    • Litman A. Lesselier D. Santosa F. Reconstruction of a two-dimensional binary obstacle by controlled evolution of a level-set Inverse Problems 14 1998 685-706
    • (1998) Inverse Problems , vol.14 , pp. 685-706
    • Litman, A.1    Lesselier, D.2    Santosa, F.3
  • 11
    • 0022029375 scopus 로고
    • Analysis and scaling of Kelvin resistors for extraction of specific contact resistivity
    • Loh W.H. Saraswat K. Dutton R.W. Analysis and scaling of Kelvin resistors for extraction of specific contact resistivity IEEE Electron. Dev. Lett. 6 1985 105-108
    • (1985) IEEE Electron. Dev. Lett. , vol.6 , pp. 105-108
    • Loh, W.H.1    Saraswat, K.2    Dutton, R.W.3
  • 12
    • 0000653948 scopus 로고    scopus 로고
    • Level set methods for optimization problems involing geometry and constraints I: Frequencies of a two-density inhomogeneous drum
    • Osher S.J. Santosa F. Level set methods for optimization problems involing geometry and constraints I: frequencies of a two-density inhomogeneous drum J. Comput. Phys. 171 2001 272-288
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    • Osher, S.J.1    Santosa, F.2
  • 13
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    • Fronts propagating with curvature-dependent speed: Agorithms based on Hamilton-Jacobi formulations
    • Osher S.J. Sethian J.A. Fronts propagating with curvature-dependent speed: algorithms based on Hamilton-Jacobi formulations J. Comput. Phys. 79 1988 12-49
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    • Osher, S.J.1    Sethian, J.A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.