TEM of epitaxial thin films controlled by planes extending (near) normal to interface; with application to two methods to reduce crystal orientations in polycrystalline magnetic media

Journal of the European Ceramic Society

Volumn 23, Issue 15, 2003, Pages 2879-2891

  MoberlyChan, Warren ^a   Dorsey, Paul ^b  

^a HARVARD UNIVERSITY   (United States)

^b GENERAL ELECTRIC COMPANY   (United States)

Author keywords

Co; Cr; Epitaxy; Magnetic recording media; NiAl; Oriented thin films; TEM

Indexed keywords

CRYSTAL ORIENTATION; CRYSTALLOGRAPHY; INTERFACES (MATERIALS); MAGNETIC MOMENTS; MAGNETIC STORAGE; MULTILAYERS; SUBSTRATES; SURFACE ROUGHNESS;

WRITE/READ SIGNALS;

THIN FILMS;

FILM THICKNESS;

EID: 0141683657     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0955-2219(03)00299-1     Document Type: Article

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