COMPUTER ANALYSIS of ELECTRON DIFFRACTION from THIN FILMS

Microscopy and Microanalysis

Volumn 4, Issue , 1998, Pages 344-345

  MoberlyChan, Warren ^a   Kilaas, R ^b   Chan, L H ^a   Nolan, T ^a   Dorsey, P ^a   Cao, W ^a   Lu, M ^a   Gopal, M ^b   Yamashita, T ^a  

^a WESTERN DIGITAL CORPORATION   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85180285376     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S143192760002184X     Document Type: Article

References (3)

1. D. M. software is manufactured by Gatan, Inc., Pleasanton, CA; and RA is a free plug-in from NCEM.
2. T. Nolan, R. Sinclair, T. Yamashita, & R. Ranjan, Ultramicroscopy, V47, (1992) 437.
3. M. Gopal, W. MoberlyChan, & L. De Jonghe, /. Math. Sci., V32, (1997) 6001-6008.