The effects of film thickness of ortho-nitrobenzaldehyde modified PZT on the crystallization and ferroelectric properties

Ferroelectrics

Volumn 263, Issue 1, 2001, Pages 335-340

  Ha, Su Min ^a   Kim, Woo Sik ^a   Park, Hyung Ho ^a   Kim, Tae Song ^b  

^a Yonsei University   (South Korea)

^b Korea Institute of Science and Technology   (South Korea)

Author keywords

molar concentration; photosensitizer; PZT

Indexed keywords

ELECTRICAL PROPERTY; FERROELECTRIC PROPERTY; FINE GRAINS; MOLAR CONCENTRATION; NITROBENZALDEHYDE; PREFERRED ORIENTATIONS; PZT; PZT FILM; REMNANT POLARIZATIONS; STOCK SOLUTIONS;

ALDEHYDES; PHOTOSENSITIZERS; SHRINKAGE; THICK FILMS;

ELECTRIC PROPERTIES;

EID: 0141663434     PISSN: 00150193     EISSN: 15635112     Source Type: Journal    
DOI: 10.1080/00150190108225221     Document Type: Conference Paper

References (4)

1. Kingon. A.I, and Streiffer. S.K, Current Opinion in Solid State and Materials Science, 4 (1999) 39
2. Y. Nakao, T. Nakamura, K. Hoshiba, K. Sameshima, A. Kamisawa, K. Abe, N. Soyama and K. Ogi, Jpn. J. Appl. Phys., 32 (1993) 4141
3. J. K. Lee, T. Y. Kim, I. Chung and S. B. Desu, Appl. Phys. Lett., 75, (1999) 334
4. S. Y. Chen, and I. W. Chen, J. Am. Ceram. Soc., 81[1] (1998) 97.