Cosmic-Ray Multi-Error Immunity for SRAM, Based on Analysis of the Parasitic Bipolar Effect

IEEE Symposium on VLSI Circuits, Digest of Technical Papers

Volumn , Issue , 2003, Pages 255-258

  Osada, Kenichi ^a   Yamaguchi, Ken ^a   Saitoh, Yoshikazu ^a   Kawahara, Takuyuki ^a  

^a HITACHI LTD   (Japan)

Author keywords

Cosmic ray; Memory; Parasitic bipolar effect; Soft error; SRAM

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER ARCHITECTURE; COSMIC RAYS; ELECTRIC POTENTIAL;

MULTI-ERROR IMMUNITY;

STATIC RANDOM ACCESS STORAGE;

EID: 0141649390     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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