Successive multilayer formation of cyclolinear polyorganosiloxanes floating at the Air-Water interface. A synchrotron X-ray reflectivity investigation

Macromolecules

Volumn 36, Issue 19, 2003, Pages 7236-7243

  Jensen, T R ^a   Kjaer, K ^b   Brezesinski, G ^c   Ruiz Garcia, J ^c,d   Mohwald H ^c   Makarova, N N ^e   Godovsky, Yu K ^f  

^a AARHUS UNIVERSITY   (Denmark)

^b TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

^c MAX PLANCK INSTITUTE OF COLLOIDS AND INTERFACES   (Germany)

^d UNIVERSIDAD AUTÓNOMA DE SAN LUIS POTOSÍ   (Mexico)

^e RUSSIAN ACADEMY OF SCIENCES   (Russian Federation)

^f KARPOV INSTITUTE OF PHYSICAL CHEMISTRY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLOGRAPHY; ELECTRONIC DENSITY OF STATES; INTERFACES (MATERIALS); MATHEMATICAL MODELS; MONOMERS; MULTILAYERS; NANOSTRUCTURED MATERIALS; REFLECTION; SYNCHROTRONS; THICKNESS MEASUREMENT; ULTRATHIN FILMS; X RAY ANALYSIS;

CYCLOLINEAR POLYORGANOSILOXANES; SILOXANE POLYMERS; SYNCHROTRON X RAY REFLECTIVITY;

SILICONES;

EID: 0141620345     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma034473c     Document Type: Article

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