Applied rolling and sensitivity of Bi(2223)/Ag tapes on Ic degradation by mechanical stress

Superconductor Science and Technology

Volumn 12, Issue 3, 1999, Pages 168-171

  Kovac P ^a   Richens, P E ^b   Bukva, P ^a   Jones, H ^b   Husek I ^a  

^a INSTITUTE OF ELECTRICAL ENGINEERING   (Slovakia)

^b UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

BENDING (DEFORMATION); CRITICAL CURRENTS; DEGRADATION; ELECTRIC CURRENT MEASUREMENT; MAGNETIC TAPE; MICROCRACKS; ROLLING; SINTERING; TENSILE STRESS;

BENDING STRESS; FILAMENT DENSITY;

OXIDE SUPERCONDUCTORS;

EID: 0032653974     PISSN: 09532048     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-2048/12/3/011     Document Type: Article

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