Current-induced magnetic field detection by magnetic force microscopy around a GaAs/AlGaAs mesa stripe

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 42, Issue 7 B, 2003, Pages 4874-4877

  Saida, Daisuke ^a   Takahashi, Takuji ^a  

^a INSTITUTE OF INDUSTRIAL SCIENCE   (Japan)

Author keywords

Current detection; Electrostatic force; Magnetic field; Magnetic force microscopy (MFM)

Indexed keywords

ELECTRIC CURRENTS; MAGNETIC FIELDS; MAGNETIZATION; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR QUANTUM WELLS; SUBSTRATES; SURFACES;

ALUMINUM GALLIUM ARSENIDE; CURRENT-INDUCED MAGNETIC FIELD DETECTION; ELECTROSTATIC FORCE; MAGNETIC FORCE MICROSCOPY;

MICROSCOPIC EXAMINATION;

EID: 0141569179     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.42.4874     Document Type: Article

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