SOI-based photonic crystal line-defect waveguides

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4870, Issue , 2002, Pages 324-338

  Yamada, K ^a   Notomi, M ^a   Shinya, A ^a   Yokohama, I ^a   Shoji, T ^a   Tsuchizawa, T ^a   Watanabe, T ^a   Takahashi, J ^a   Tamechika, E ^a   Morita, H ^a  

^a NTT CORPORATION   (Japan)

Author keywords

Converter; Dispersion; Group velocity; Line defect waveguide; Mode profile; Photonic band gap; Photonic crystal; Silicon wire; SOI

Indexed keywords

BAND STRUCTURE; CRYSTAL DEFECTS; CRYSTALLINE MATERIALS; ELECTRIC LOSSES; ELECTROMAGNETIC DISPERSION; LIGHT TRANSMISSION; LSI CIRCUITS; PHOTONS; SILICA; SILICON ON INSULATOR TECHNOLOGY; TUNING;

LINE-DEFECT WAVEGUIDES; PHOTONIC CRYSTALS (PC);

OPTICAL WAVEGUIDES;

EID: 0141551904     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.475545     Document Type: Conference Paper

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