Selecting measurements to test the functional behavior of analog circuits

Journal of Electronic Testing: Theory and Applications (JETTA)

Volumn 9, Issue 1-2, 1996, Pages 9-18

  Van Spaandonk, J ^a   Kevenaar, T A M ^a,b  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

Analogue circuits; Automatic testing; Circuit testing

Indexed keywords

ALGORITHMS; APPROXIMATION THEORY; AUTOMATIC TESTING; ITERATIVE METHODS; LINEAR INTEGRATED CIRCUITS; MATRIX ALGEBRA; MEASUREMENT ERRORS;

ANALOG CIRCUITS; FUNCTIONAL TESTING; MATRIX DECOMPOSITION TECHNIQUES;

INTEGRATED CIRCUIT TESTING;

EID: 0030206069     PISSN: 09238174     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF00137561     Document Type: Article

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