-
1
-
-
0002124963
-
Differential microinterferometer with polarized waves
-
G. Nomarski, "Differential microinterferometer with polarized waves," J. Phys. Radium 16, 9s-13s (1955).
-
(1955)
J. Phys. Radium
, vol.16
-
-
Nomarski, G.1
-
2
-
-
85075801748
-
A review of DIC
-
in Phase Contrast and Differential Interference Contrast Imaging Techniques and Applications, M. Pluta and M. Szyjer, Eds.
-
M. Pluta, "A review of DIC," in Phase Contrast and Differential Interference Contrast Imaging Techniques and Applications, M. Pluta and M. Szyjer, Eds., Proc. SPIE 1846, 10-24 (1992).
-
(1992)
Proc. SPIE
, vol.1846
, pp. 10-24
-
-
Pluta, M.1
-
3
-
-
0018433491
-
Quantitative surface topography determination by Nomarski reflection microscopy. 1. Theory
-
D. L. Lessor, J. S. Hartman, and R. L. Gordon, "Quantitative surface topography determination by Nomarski reflection microscopy. 1. Theory," J. Opt. Soc. Am. 69, 357-365 (1979).
-
(1979)
J. Opt. Soc. Am.
, vol.69
, pp. 357-365
-
-
Lessor, D.L.1
Hartman, J.S.2
Gordon, R.L.3
-
4
-
-
0019057044
-
Quantitative surface topography determination by Nomarski reflection microscopy. 2. Microscope modification, calibration, and planer sample experiments
-
J. S. Hartman, R. S. Gordon, and D. L. Lessor, "Quantitative surface topography determination by Nomarski reflection microscopy. 2. Microscope modification, calibration, and planer sample experiments," Appl. Opt. 19, 2998-3009 (1980).
-
(1980)
Appl. Opt.
, vol.19
, pp. 2998-3009
-
-
Hartman, J.S.1
Gordon, R.S.2
Lessor, D.L.3
-
5
-
-
0019606516
-
Nomarski differential interference contrast microscopy for surface slope measurements: An examination of techniques
-
J. S. Hartman, R. S. Gordon, and D. L. Lessor, "Nomarski differential interference contrast microscopy for surface slope measurements: an examination of techniques," Appl. Opt. 20, 2665-2669 (1981).
-
(1981)
Appl. Opt.
, vol.20
, pp. 2665-2669
-
-
Hartman, J.S.1
Gordon, R.S.2
Lessor, D.L.3
-
6
-
-
0141602005
-
Interference contrast employed to measure slopes on metallographic specimens
-
U. Bertocci and T. S. Noggle, "Interference contrast employed to measure slopes on metallographic specimens," Rev. Sci. Instrum. 37, 1750-1751 (1966).
-
(1966)
Rev. Sci. Instrum.
, vol.37
, pp. 1750-1751
-
-
Bertocci, U.1
Noggle, T.S.2
-
7
-
-
84957507261
-
Characterization of mirror surfaces for laser-gyro applications
-
in Surface Measurement and Characterization, J. M. Bennett, Ed.
-
D.-R. Schmitt, "Characterization of mirror surfaces for laser-gyro applications," in Surface Measurement and Characterization, J. M. Bennett, Ed., Proc. SPIE 1009, 155-164 (1988).
-
(1988)
Proc. SPIE
, vol.1009
, pp. 155-164
-
-
Schmitt, D.-R.1
-
8
-
-
0022197569
-
Surface-roughness measurement by digital processing of Nomarski phase-contrast images
-
S. N. Jabr, "Surface-roughness measurement by digital processing of Nomarski phase-contrast images," Opt. Lett. 10, 526-528 (1985).
-
(1985)
Opt. Lett.
, vol.10
, pp. 526-528
-
-
Jabr, S.N.1
-
9
-
-
84957531758
-
Digitally enhanced micro-interferometry
-
in Ultra Precision Machining and Automated Fabrication of Optics, D. L. Decker and R. A. Jones, Eds.
-
S. N. Jabr, "Digitally enhanced micro-interferometry," in Ultra Precision Machining and Automated Fabrication of Optics, D. L. Decker and R. A. Jones, Eds., Proc. SPIE 676, 159-164 (1986).
-
(1986)
Proc. SPIE
, vol.676
, pp. 159-164
-
-
Jabr, S.N.1
-
10
-
-
0141490478
-
Linear and differential techniques in the scanning optical microscope
-
in Scanning Microscopy Technologies and Applications, E. C. Teague, Eds.
-
M. Vaez Iravani and C. W. See, "Linear and differential techniques in the scanning optical microscope," in Scanning Microscopy Technologies and Applications, E. C. Teague, Eds., Proc. SPIE 897, 43-54 (1988).
-
(1988)
Proc. SPIE
, vol.897
, pp. 43-54
-
-
Iravani, M.V.1
See, C.W.2
-
11
-
-
0030151435
-
Differential interference contrast microscope with differential detection for optimizing image contrast
-
H. Ooki, Y. Iwasaki, and J. Iwasaki, "Differential interference contrast microscope with differential detection for optimizing image contrast," Appl. Opt. 35, 2230-2234 (1996).
-
(1996)
Appl. Opt.
, vol.35
, pp. 2230-2234
-
-
Ooki, H.1
Iwasaki, Y.2
Iwasaki, J.3
-
12
-
-
0043152847
-
Phase stepping DIC technique for reflecting surface evaluation
-
in Phase Contrast and Differential Interference Contrast Imaging Techniques and Applications, M. Pluta and M. Szyjer, Eds.
-
M. Sochacka and L. R. Staronski, "Phase stepping DIC technique for reflecting surface evaluation," in Phase Contrast and Differential Interference Contrast Imaging Techniques and Applications, M. Pluta and M. Szyjer, Eds., Proc. SPIE 1846, 222-233 (1992).
-
(1992)
Proc. SPIE
, vol.1846
, pp. 222-233
-
-
Sochacka, M.1
Staronski, L.R.2
-
13
-
-
0035329371
-
Optical profilometer based on the principle of differential interference
-
Q. Li, H. Gao, S. Xue, and Y. Li, "Optical profilometer based on the principle of differential interference," Opt. Eng. 40, 833-836 (2001).
-
(2001)
Opt. Eng.
, vol.40
, pp. 833-836
-
-
Li, Q.1
Gao, H.2
Xue, S.3
Li, Y.4
-
14
-
-
0001260804
-
Analysis and design of modified Wollaston prism
-
C. C. Montarou and T. K. Gaylord, "Analysis and design of modified Wollaston prism," Appl. Opt. 38, 6604-6616 (1999).
-
(1999)
Appl. Opt.
, vol.38
, pp. 6604-6616
-
-
Montarou, C.C.1
Gaylord, T.K.2
-
15
-
-
84975624501
-
Simple ray tracing formulas for uniaxial optical crystals
-
Q. T. Liang, "Simple ray tracing formulas for uniaxial optical crystals," Appl. Opt. 29, 1008-1010 (1990).
-
(1990)
Appl. Opt.
, vol.29
, pp. 1008-1010
-
-
Liang, Q.T.1
-
16
-
-
0043045472
-
Direction cosines and vectorial relations for extraordinary-wave propagation in uniaxial media
-
E. Cojocaru, "Direction cosines and vectorial relations for extraordinary-wave propagation in uniaxial media," Appl. Opt. 36, 302-305 (1997).
-
(1997)
Appl. Opt.
, vol.36
, pp. 302-305
-
-
Cojocaru, E.1
-
17
-
-
0141602004
-
Design of Nomarski prism for differential interference contrast microscope using ray tracing method
-
Indore
-
S. Chatterjee, "Design of Nomarski prism for differential interference contrast microscope using ray tracing method," in Proc. Nat. Laser Symp., pp. 209-210, Indore (2001).
-
(2001)
Proc. Nat. Laser Symp.
, pp. 209-210
-
-
Chatterjee, S.1
-
18
-
-
0001727060
-
Polarizers
-
M. Bass, E. W. Stryland, D. R. Williams, and W. L. Wolfe, Eds.; McGraw-Hill, New York
-
J. M. Bennett, "Polarizers" in Hand Book of Optics, 2nd ed. M. Bass, E. W. Stryland, D. R. Williams, and W. L. Wolfe, Eds. Vol. II, pp. 3.3-3.4, McGraw-Hill, New York (1995).
-
(1995)
Hand Book of Optics, 2nd Ed.
, vol.2
-
-
Bennett, J.M.1
-
19
-
-
0000058245
-
Microscopes
-
M. Bass, E. W. Stryland, D. R. Williams, and W. L. Wolfe, Eds.; McGraw-Hill, New York
-
S. Inoue and R. Oldenbourg, "Microscopes," in Hand Book of Optics, 2nd ed., M. Bass, E. W. Stryland, D. R. Williams, and W. L. Wolfe, Eds., Vol. II, pp. 17.6-17.9, McGraw-Hill, New York (1995).
-
(1995)
Hand Book of Optics, 2nd Ed.
, vol.2
-
-
Inoue, S.1
Oldenbourg, R.2
-
20
-
-
0345504197
-
Conoscopic interferometry of surface-acoustic-wave substrate crystals
-
P. H. Ayras, A. T. Friberg, M. A. J. Kaivola, and M. M. Salomaa, "Conoscopic interferometry of surface-acoustic-wave substrate crystals," Appl. Opt. 38, 5399-5407 (1999).
-
(1999)
Appl. Opt.
, vol.38
, pp. 5399-5407
-
-
Ayras, P.H.1
Friberg, A.T.2
Kaivola, M.A.J.3
Salomaa, M.M.4
-
21
-
-
0141602003
-
Design considerations of reflected light Nomarski microscope
-
Indore
-
S. Chatterjee, "Design considerations of reflected light Nomarski microscope," in Proc. Nat. Laser Symp., pp. 211-212, Indore (2001).
-
(2001)
Proc. Nat. Laser Symp.
, pp. 211-212
-
-
Chatterjee, S.1
|