Differential interference contrast microscope with differential detection for optimizing image contrast

Applied Optics

Volumn 35, Issue 13, 1996, Pages 2230-2234

  Ooki, Hiroshi ^a   Iwasaki, Yutaka ^a   Iwasaki, Jun ^a  

^a NIKON CORPORATION   (Japan)

Author keywords

Differential detection; Differential interference contrast; Laser scanning microscope

Indexed keywords

CHARGE COUPLED DEVICES; DIFFRACTION; FOURIER OPTICS; HELIUM NEON LASERS; IMAGING TECHNIQUES; INTEGRATION; MASKS; OPTICAL BEAM SPLITTERS; OPTICAL ROTATION; PRISMS; SURFACE STRUCTURE;

DIFFERENTIAL DETECTION; DIFFERENTIAL INTERFERENCE CONTRAST MICROSCOPE; HALF WAVE PLATE; IMAGE CONTRAST; LASER SCANNING; POLARIZING BEAM SPLITTER;

MICROSCOPES;

EID: 0030151435     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.35.002230     Document Type: Article

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