메뉴 건너뛰기




Volumn 19, Issue 4, 2003, Pages 366-370

Preparation and characterization of anodic aluminum oxide films with nanopore arrays

Author keywords

Anodic aluminum oxide (AAO); Atom force microscope (AFM); Microscope (SEM); Nanopore array; Preparation; Scanning electron

Indexed keywords

ALUMINUM OXIDE;

EID: 0141518117     PISSN: 10014861     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (6)

References (12)
  • 4
    • 0032205746 scopus 로고    scopus 로고
    • Jessensky O., Muller F., Gosele U. Appl. Phys. Lett., 1998, 72, 1173; J. Electrochem. Soc., 1998, 145, 3735.
    • (1998) J. Electrochem. Soc. , vol.145 , pp. 3735


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.